- test for yield
- испытания на выход годных
The English-Russian dictionary on reliability and quality control. 2015.
test for yield
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Test probe — Typical passive oscilloscope probe being used for testing an integrated circuit. A test probe (test lead, test prod, or scope probe) is a physical device used to connect electronic test equipment to the device under test (DUT). They range from… … Wikipedia
test — 1. To prove; to try a substance; to determine the chemical nature of a substance by means of reagents. 2. A method of examination, as to determine the presence or absence of a definite disease or of some substance in any of the fluids, tissues,… … Medical dictionary
Test No. 6 — Country China Test site Lop Nur Test Base Period June 17, 1967 Number of tests 1 Test type Atmospheric Device type Fusion Max. yield … Wikipedia
Test engineer — A (hardware) test engineer (TE) is a professional who determines how to create a process that would test a particular product in manufacturing, or related area like RMA department, in order to guarantee that the product will be shipped out with… … Wikipedia
Yield (engineering) — The yield strength or yield point of a material is defined in engineering and materials science as the stress at which a material begins to deform plastically. Prior to the yield point the material will deform elastically and will return to its… … Wikipedia
Design for manufacturability (IC) — For a general explanation outside the integrated circuit topic, see Design for manufacturability (disambiguation). Achieving high yielding designs in the state of the art, VLSI technology has become an extremely challenging task due to the… … Wikipedia
Design For Test — (aka Design for Testability or DFT ) is a name for design techniques that add certain testability features to a microelectronic hardware product design. The premise of the added features is that they make it easier to develop and apply… … Wikipedia
Design for testing — Design for Test (aka Design for Testability or DFT ) is a name for design techniques that add certain testability features to a microelectronic hardware product design. The premise of the added features is that they make it easier to develop and… … Wikipedia
Student's t-test — A t test is any statistical hypothesis test in which the test statistic follows a Student s t distribution if the null hypothesis is supported. It is most commonly applied when the test statistic would follow a normal distribution if the value of … Wikipedia
Miller–Rabin primality test — The Miller–Rabin primality test or Rabin–Miller primality test is a primality test: an algorithm which determines whether a given number is prime, similar to the Fermat primality test and the Solovay–Strassen primality test. Its original version … Wikipedia
HIV test — Randall L. Tobias, former U.S. Global AIDS Coordinator, being publicly tested for HIV in Ethiopia in an effort to reduce the stigma of being tested.[1] HIV tests are used to detect the presence of the human immunodeficiency virus (HIV), the virus … Wikipedia
